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$Automated nanocrystal orientation and phase mapping in the transmission electron microscope on the basis of precession electron diffraction$

Automated nanocrystal orientation and phase mapping in the transmission electron microscope on the basis of precession electron diffraction

Rauch, Edgar F.; Portillo, Joaquin; Nicolopoulos, Stavros; Bultreys, Daniel; Rouvimov, Sergei; Moeck, Peter

期刊名称Zeitschrift für Kristallographie
作者Rauch, Edgar F.; Portillo, Joaquin; Nicolopoulos, Stavros; Bultreys, Daniel; Rouvimov, Sergei; Moeck, Peter
卷第225卷
印刷ISSN0044-2968
文件大小182.43KB
发表时间2010-01
DOI10.1524/zkri.2010.1205

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