Mapping Quantitative Trait Loci for Partial Resistance to in a Soybean Interspecific Cross

Tucker, D. M.; Saghai Maroof, M. A.; Mideros, S.; Skoneczka, J. A.; Nabati, D. A.; Buss, G. R.; Hoeschele, I.; Tyler, B.M.; St. Martin, S. K.; Dorrance, A. E.

期刊名称Crop Science
作者Tucker, D. M.; Saghai Maroof, M. A.; Mideros, S.; Skoneczka, J. A.; Nabati, D. A.; Buss, G. R.; Hoeschele, I.; Tyler, B.M.; St. Martin, S. K.; Dorrance, A. E.
卷第50卷
期第2期
电子ISSN1435-0653
文件大小1032.28KB
发表时间2010
DOI10.2135/cropsci2009.03.0161

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Mapping Quantitative Trait Loci for Partial Resistance to in a Soybean Interspecific Cross