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Why do people get phished? Testing individual differences in phishing vulnerability within an integrated, information processing model

Why do people get phished? Testing individual differences in phishing vulnerability within an integrated, information processing model

Arun Vishwanath; Tejaswini Herath; Rui Chen; Jingguo Wang; H. Raghav Rao
  • 作者Arun Vishwanath; Tejaswini Herath; Rui Chen; Jingguo Wang; H. Raghav Rao
  • 卷第51卷
  • 期第3期
  • 印刷ISSN0167-9236
  • 文件大小269.77KB
  • 发表时间2011
  • DOI10.1016/j.dss.2011.03.002
  • 页码576-586
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