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Fabrication, characterization and testing of thin films with novel microstructures

Fabrication, characterization and testing of thin films with novel microstructures

Seong-Woong Kim; K. Sharvan Kumar

作者Seong-Woong Kim; K. Sharvan Kumar
卷第64卷
期第7期
印刷ISSN1359-6462
文件大小483.98KB
发表时间2011
DOI10.1016/j.scriptamat.2010.12.005
页码629-632

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