An Engineering Model for Single-Event Effects and Soft Error Rates in Bulk CMOS
- 作者Fulkerson, D.E.
- 卷第58卷
- 期第2期
- 印刷ISSN0018-9499
- 电子ISSN1558-1578
- 文件大小542.08KB
- 发表时间2011
- DOI10.1109/tns.2011.2106801
- 页码506-515
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