Evaluating Complexity, Code Churn, and Developer Activity Metrics as Indicators of Software Vulnerabilities
- 作者Yonghee Shin; Meneely, A.; Williams, L.; Osborne, J.A.
- 卷第37卷
- 期第6期
- 印刷ISSN0098-5589
- 文件大小2304.09KB
- 发表时间2011
- DOI10.1109/tse.2010.81
- 页码772-787
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