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Microstructure Evolution of Sputtered Bi-Te Films during Post-Annealing: Phase Transformation and Its Effects on the Thermoelectric Properties

Microstructure Evolution of Sputtered Bi-Te Films during Post-Annealing: Phase Transformation and Its Effects on the Thermoelectric Properties

Jeon, Seong-jae; Oh, Minsub; Jeon, Haseok; Kang, Stephen D.; Lyeo, Ho-Ki; Hyun, Seungmin; Lee, Hoo-jeong
  • 作者Jeon, Seong-jae; Oh, Minsub; Jeon, Haseok; Kang, Stephen D.; Lyeo, Ho-Ki; Hyun, Seungmin; Lee, Hoo-jeong
  • 卷第158卷
  • 期第8期
  • 印刷ISSN0013-4651
  • 文件大小1567.15KB
  • 发表时间2011
  • DOI10.1149/1.3598174
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