In Flight SEU/MCU Sensitivity of Commercial Nanometric SRAMs: Operational Estimations

Artola, Laurent; Velazco, Raoul; Hubert, Guillaume; Duzellier, Sophie; Nuns, Thierry; Guerard, Bruno; Peronnard, Paul; Mansour, Wassim; Pancher, Fabrice; Bezerra, Francoise

期刊名称IEEE Transactions on Nuclear Science
作者Artola, Laurent; Velazco, Raoul; Hubert, Guillaume; Duzellier, Sophie; Nuns, Thierry; Guerard, Bruno; Peronnard, Paul; Mansour, Wassim; Pancher, Fabrice; Bezerra, Francoise
卷第58卷
期第6期
印刷ISSN0018-9499
文件大小1249.78KB
发表时间2011-12
DOI10.1109/TNS.2011.2172220
页码2644-2651

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In Flight SEU/MCU Sensitivity of Commercial Nanometric SRAMs: Operational Estimations