Small-scale patterning methods for digital image correlation under scanning electron microscopy
- 期刊名称Measurement Science and Technology
- 作者Kammers, A D; Daly, S
- 卷第22卷
- 期第12期
- 印刷ISSN0957-0233
- 电子ISSN1361-6501
- 文件大小2747.73KB
- 发表时间2011-12-01
- DOI10.1088/0957-0233/22/12/125501
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