Surface and Thin Film Analysis (A Compendium of Principles, Instrumentation, and Applications) || Auger Electron Spectroscopy (AES)
- 作者Friedbacher, Gernot; Bubert, Henning
- 文件大小473.23KB
- 发表时间2011
- DOI10.1002/9783527636921.ch3
- 页码43-65
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