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Electrical modulus analysis on the Ni/CCTO/PVDF system near the percolation threshold

Electrical modulus analysis on the Ni/CCTO/PVDF system near the percolation threshold

Yang, Wenhu; Yu, Shuhui; Sun, Rong; Ke, Shanming; Huang, Haitao; Du, Ruxu
  • 期刊名称Journal of Physics D: Applied Physics
  • 作者Yang, Wenhu; Yu, Shuhui; Sun, Rong; Ke, Shanming; Huang, Haitao; Du, Ruxu
  • 卷第44卷
  • 期第47期
  • 印刷ISSN0022-3727
  • 电子ISSN1361-6463
  • 文件大小1276.47KB
  • 发表时间2011-11-30
  • DOI10.1088/0022-3727/44/47/475305
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