[IEEE 2011 IEEE VLSI Test Symposium (VTS) - Dana Point, CA, USA (2011.05.1-2011.05.5)] 29th VLSI Test Symposium - Efficient trace data compression using statically selected dictionary
- 作者Basu, Kanad; Mishra, Prabhat
- 文件大小875.82KB
- 发表时间2011
- DOI10.1109/vts.2011.5783748
- 页码14-19
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