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[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - Software reliability accelerated testing method based on test coverage

[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - Software reliability accelerated testing method based on test coverage

Wang, Shuanqi; Wu, Yumei; Lu, Minyan; Li, Haifeng

作者Wang, Shuanqi; Wu, Yumei; Lu, Minyan; Li, Haifeng
文件大小444.72KB
发表时间2011
DOI10.1109/RAMS.2011.5754463
页码1-7

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