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[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - Improvements in estimating software reliability from growth test data

[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - Improvements in estimating software reliability from growth test data

Dwyer, Dave; D'Onofrio, Paul
  • 作者Dwyer, Dave; D'Onofrio, Paul
  • 文件大小459.28KB
  • 发表时间2011
  • DOI10.1109/RAMS.2011.5754434
  • 页码1-5
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