Electric-Field-Driven Degradation in off-State Step-Stressed AlGaN/GaN High-Electron Mobility Transistors

Chang, Chih-Yang; Douglas, E. A.; Kim, Jinhyung; Lu, Liu; Lo, Chien-Fong; Chu, Byung-Hwan; Cheney, D. J.; Gila, B. P.; Ren, F.; Via, G. D.; Cullen, David A.; Zhou, Lin; Smith, David J.; Jang, Soohwan; Pearton, S. J.

期刊名称IEEE Transactions on Device and Materials Reliability
作者Chang, Chih-Yang; Douglas, E. A.; Kim, Jinhyung; Lu, Liu; Lo, Chien-Fong; Chu, Byung-Hwan; Cheney, D. J.; Gila, B. P.; Ren, F.; Via, G. D.; Cullen, David A.; Zhou, Lin; Smith, David J.; Jang, Soohwan; Pearton, S. J.
卷第11卷
期第1期
印刷ISSN1530-4388
电子ISSN1558-2574
文件大小907.31KB
发表时间2011-03
DOI10.1109/tdmr.2010.2103314
页码187-193

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Electric-Field-Driven Degradation in off-State Step-Stressed AlGaN/GaN High-Electron Mobility Transistors