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[IEEE 2011 6th IEEE International Symposium on Industrial Embedded Systems (SIES) - Vasteras, Sweden (2011.06.15-2011.06.17)] 2011 6th IEEE International Symposium on Industrial and Embedded Systems - Assessment of trace-differences in timing analysis for Complex Real-Time Embedded Systems

[IEEE 2011 6th IEEE International Symposium on Industrial Embedded Systems (SIES) - Vasteras, Sweden (2011.06.15-2011.06.17)] 2011 6th IEEE International Symposium on Industrial and Embedded Systems - Assessment of trace-differences in timing analysis for Complex Real-Time Embedded Systems

Lu, Yue; Nolte, Thomas; Bate, Iain; Kraft, Johan; Norstrom, Christer
  • 作者Lu, Yue; Nolte, Thomas; Bate, Iain; Kraft, Johan; Norstrom, Christer
  • 文件大小1035.07KB
  • 发表时间2011
  • DOI10.1109/SIES.2011.5953672
  • 页码284-293
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