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[IEEE 2011 Spanish Conference on Electron Devices (CDE) - Palma de Mallorca, Spain (2011.02.8-2011.02.11)] Proceedings of the 8th Spanish Conference on Electron Devices, CDE'2011 - Accelerated life testing leds on temperature and current

[IEEE 2011 Spanish Conference on Electron Devices (CDE) - Palma de Mallorca, Spain (2011.02.8-2011.02.11)] Proceedings of the 8th Spanish Conference on Electron Devices, CDE'2011 - Accelerated life testing leds on temperature and current

Nogueira, Eduardo; Mateos, Juan
  • 作者Nogueira, Eduardo; Mateos, Juan
  • 文件大小1030.66KB
  • 发表时间2011
  • DOI10.1109/sced.2011.5744191
  • 页码1-4
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