[IEEE 2011 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2011.09.20-2011.09.22)] 2011 IEEE International Test Conference - Efficient combination of trace and scan signals for post silicon validation and debug
- 作者Basu, Kanad; Mishra, Prabhat; Patra, Priyadarsan
- 文件大小287.62KB
- 发表时间2011
- DOI10.1109/test.2011.6139157
- 页码1-8
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