[IEEE 2011 IEEE VLSI Test Symposium (VTS) - Dana Point, CA, USA (2011.05.1-2011.05.5)] 29th VLSI Test Symposium - An analytical method for estimating SET propagation
Gangadhar, Sreenivas; Tragoudas, Spyros
- 作者Gangadhar, Sreenivas; Tragoudas, Spyros
- 文件大小620.85KB
- 发表时间2011
- DOI10.1109/vts.2011.5783783
- 页码197-202