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[IEEE 2011 IEEE/IFIP 19th International Conference on VLSI and System-on-Chip (VLSI-SoC) - Kowloon, Hong Kong (2011.10.3-2011.10.5)] 2011 IEEE/IFIP 19th International Conference on VLSI and System-on-Chip - SNM-aware power reduction and reliability improvement in 45nm SRAMs

[IEEE 2011 IEEE/IFIP 19th International Conference on VLSI and System-on-Chip (VLSI-SoC) - Kowloon, Hong Kong (2011.10.3-2011.10.5)] 2011 IEEE/IFIP 19th International Conference on VLSI and System-on-Chip - SNM-aware power reduction and reliability improvement in 45nm SRAMs

Kim, Seokjoong; Guthaus, Matthew R.

作者Kim, Seokjoong; Guthaus, Matthew R.
文件大小984.76KB
发表时间2011
DOI10.1109/vlsisoc.2011.6081666
页码204-207

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