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[IEEE 2011 IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS) - Kaohsiung, Taiwan (2011.02.20-2011.02.23)] 2011 6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems - Characterization of sidewall roughness inside porous anodic alumina template holes by scanning electron microscopy

[IEEE 2011 IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS) - Kaohsiung, Taiwan (2011.02.20-2011.02.23)] 2011 6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems - Characterization of sidewall roughness inside porous anodic alumina template holes by scanning electron microscopy

Han, Guoqiang; Chen, Shu; Zhang, Dong
  • 作者Han, Guoqiang; Chen, Shu; Zhang, Dong
  • 文件大小2095.01KB
  • 发表时间2011
  • DOI10.1109/nems.2011.6017538
  • 页码1056-1059
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