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Depth-profiling the composition of bimetallic nanoparticles using medium energy ion scattering

Depth-profiling the composition of bimetallic nanoparticles using medium energy ion scattering

Johan Gustafson; Andrew R. Haire; Christopher J. Baddeley
  • 作者Johan Gustafson; Andrew R. Haire; Christopher J. Baddeley
  • 卷第605卷
  • 印刷ISSN0039-6028
  • 文件大小395.04KB
  • 发表时间2011
  • DOI10.1016/j.susc.2010.10.022
  • 页码220-224
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