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[IEEE 2011 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2011.04.25-2011.04.28)] Proceedings of 2011 International Symposium on VLSI Design, Automation and Test - Technology scaling: A system perspective

[IEEE 2011 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2011.04.25-2011.04.28)] Proceedings of 2011 International Symposium on VLSI Design, Automation and Test - Technology scaling: A system perspective

文件大小9229.28KB
发表时间2011
DOI10.1109/VDAT.2011.5783568
页码1-16

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