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Atomic Resolved Secondary Electron Imaging with an Aberration Corrected Scanning Transmission Electron Microscope

Inada, H; Tamura, K; Nakamura, K; Suzuki, Y; Konno, M; Su, D; Wall, J; Egerton, R; Zhu, Y

期刊名称Microscopy and Microanalysis
作者Inada, H; Tamura, K; Nakamura, K; Suzuki, Y; Konno, M; Su, D; Wall, J; Egerton, R; Zhu, Y
卷第17卷
印刷ISSN1431-9276
电子ISSN1435-8115
文件大小454.57KB
发表时间2011-7
DOI10.1017/s1431927611007367
页码1298-1299