SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Monday 23 May 2011)] Optical Measurement Systems for Industrial Inspection VII - Adaptive holographic illumination in comparative electronic speckle pattern interferometry
Séfel, Richárd; Lehmann, Peter H.; Osten, Wolfgang; Kornis, János; Varga-Fogarasi, Szilvia; Gastinger, Kay
- 作者Séfel, Richárd; Lehmann, Peter H.; Osten, Wolfgang; Kornis, János; Varga-Fogarasi, Szilvia; Gastinger, Kay
- 卷第8082卷
- 印刷ISSN0277-786X
- 文件大小2952.44KB
- 发表时间2011
- DOI10.1117/12.889366