Analysis of organic semiconductor multilayers with Ar cluster secondary ion mass spectrometry
- 作者Satoshi Ninomiya; Kazuya Ichiki; Hideaki Yamada; Yoshihiko Nakata; Toshio Seki; Takaaki Aoki; Jiro Matsuo
- 卷第43卷
- 印刷ISSN0142-2421
- 电子ISSN1096-9918
- 文件大小149.28KB
- 发表时间2011
- DOI10.1002/sia.3587
- 页码95-98