![SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optical Metrology and Inspection for Industrial Applications - Calibration of a phase-based 3D imaging system based on uneven fringe projection technique]()
SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optical Metrology and Inspection for Industrial Applications - Calibration of a phase-based 3D imaging system based on uneven fringe projection techniqueZhang, Zonghua; Harding, Kevin; Huang, Peisen S.; Ma, Haiyan; Feng, Hui; Yoshizawa, Toru; Jing, Zhao; Guo, Tong; Zhang, Sixiang · 2010