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In Situ Characterization of Thin Film Growth || Ultraviolet photoemission spectroscopy (UPS) for in situ characterization of thin film growth

In Situ Characterization of Thin Film Growth || Ultraviolet photoemission spectroscopy (UPS) for in situ characterization of thin film growth

Shen, K.M.
  • 作者Shen, K.M.
  • 文件大小1070.50KB
  • 发表时间2011
  • DOI10.1533/9780857094957.2.55
  • 页码55-74
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