Observation of topography using resonant scattering and its SEM images
Negishi, R.; Fukamachi, T.; Hirano, K.; Kanematsu, Y.; Hirano, K.; Kawamura, T.
- 期刊名称Acta Crystallographica Section A Foundations of Crystallography
- 作者Negishi, R.; Fukamachi, T.; Hirano, K.; Kanematsu, Y.; Hirano, K.; Kawamura, T.
- 卷第67卷
- 印刷ISSN0108-7673
- 文件大小1054.84KB
- 发表时间2011-08-22
- DOI10.1107/s010876731108888x