Robust FDI Determinants: Bayesian Model Averaging in the Presence of Selection Bias
Eicher, Theo S.; Helfman, Lindy; Lenkoski, Alex
- 期刊名称SSRN Electronic Journal
- 作者Eicher, Theo S.; Helfman, Lindy; Lenkoski, Alex
- 电子ISSN1556-5068
- 文件大小176.75KB
- 发表时间2011
- DOI10.2139/ssrn.2054934