Diameter and Polarization-Dependent Raman Scattering Intensities of Semiconductor Nanowires
Lopez, Francisco J.; Hyun, Jerome K.; Givan, Uri; Kim, In Soo; Holsteen, Aaron L.; Lauhon, Lincoln J.
- 作者Lopez, Francisco J.; Hyun, Jerome K.; Givan, Uri; Kim, In Soo; Holsteen, Aaron L.; Lauhon, Lincoln J.
- 卷第12卷
- 期第5期
- 印刷ISSN1530-6984
- 电子ISSN1530-6992
- 文件大小2618.86KB
- 发表时间2012
- DOI10.1021/nl204537d
- 页码2266-2271