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Diameter and Polarization-Dependent Raman Scattering Intensities of Semiconductor Nanowires

Diameter and Polarization-Dependent Raman Scattering Intensities of Semiconductor Nanowires

Lopez, Francisco J.; Hyun, Jerome K.; Givan, Uri; Kim, In Soo; Holsteen, Aaron L.; Lauhon, Lincoln J.
  • 作者Lopez, Francisco J.; Hyun, Jerome K.; Givan, Uri; Kim, In Soo; Holsteen, Aaron L.; Lauhon, Lincoln J.
  • 卷第12卷
  • 期第5期
  • 印刷ISSN1530-6984
  • 电子ISSN1530-6992
  • 文件大小2618.86KB
  • 发表时间2012
  • DOI10.1021/nl204537d
  • 页码2266-2271
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