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IR study of fundamental chemical reactions in atomic layer deposition of HfO2 with tetrakis(ethylmethylamino)hafnium (TEMAH), ozone, and water vapor

IR study of fundamental chemical reactions in atomic layer deposition of HfO2 with tetrakis(ethylmethylamino)hafnium (TEMAH), ozone, and water vapor

F. Hirose; Y. Kinoshita; K. Kanomata; K. Momiyama; S. Kubota; K. Hirahara; Y. Kimura; M. Niwano
  • 作者F. Hirose; Y. Kinoshita; K. Kanomata; K. Momiyama; S. Kubota; K. Hirahara; Y. Kimura; M. Niwano
  • 卷第258卷
  • 期第19期
  • 印刷ISSN0169-4332
  • 文件大小716.40KB
  • 发表时间2012
  • DOI10.1016/j.apsusc.2012.04.130
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