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[IEEE 2012 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2012.04.23-2012.04.25)] Proceedings of Technical Program of 2012 VLSI Design, Automation and Test - Emerging memory technology perspective

[IEEE 2012 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2012.04.23-2012.04.25)] Proceedings of Technical Program of 2012 VLSI Design, Automation and Test - Emerging memory technology perspective

Bez, R.; Cappelletti, P.

作者Bez, R.; Cappelletti, P.
文件大小449.72KB
发表时间2012
DOI10.1109/vlsi-dat.2012.6212610
页码1-2

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