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Self-stigma of mental illness scale—short form: Reliability and validity

Self-stigma of mental illness scale—short form: Reliability and validity

Patrick W. Corrigan; Patrick J. Michaels; Eduardo Vega; Michael Gause; Amy C. Watson; Nicolas Rüsch
  • 作者Patrick W. Corrigan; Patrick J. Michaels; Eduardo Vega; Michael Gause; Amy C. Watson; Nicolas Rüsch
  • 卷第199卷
  • 期第1期
  • 文件大小153.51KB
  • 发表时间2012
  • DOI10.1016/j.psychres.2012.04.009
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