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Defect Level and Fault Coverage in Coefficient Based Analog Circuit Testing

Defect Level and Fault Coverage in Coefficient Based Analog Circuit Testing

Suraj Sindia, Vishwani D. Agrawal, Virendra Singh

作者Suraj Sindia, Vishwani D. Agrawal, Virendra Singh
卷第28卷
期第4期
文件大小444.03KB
发表时间2012-08
DOI10.1007/s10836-012-5305-4
页码541-549

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