Parametric Fault Testing of Non-Linear Analog Circuits Based on Polynomial and V-Transform Coefficients

• 作者Suraj Sindia, Vishwani D. Agrawal, Virendra Singh
• 卷第28卷
• 期第5期
• 文件大小706.19KB
• 发表时间2012-10
• DOI10.1007/s10836-012-5326-z
• 页码757-771