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Modeling to predict the time evolution of negative bias temperature instability (NBTI) induced single event transient pulse broadening

Modeling to predict the time evolution of negative bias temperature instability (NBTI) induced single event transient pulse broadening

ShuMing Chen; JianJun Chen; YaQing Chi; FanYu Liu; YiBai He
  • 作者ShuMing Chen; JianJun Chen; YaQing Chi; FanYu Liu; YiBai He
  • 卷第55卷
  • 期第4期
  • 文件大小661.35KB
  • 发表时间2012-04
  • DOI10.1007/s11431-012-4747-3
  • 页码1101-1106
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