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Backend dielectric reliability simulator for microprocessor system

Backend dielectric reliability simulator for microprocessor system

Chang-Chih Chen; Fahad Ahmed; Dae Hyun Kim; Sung Kyu Lim; Linda Milor
  • 作者Chang-Chih Chen; Fahad Ahmed; Dae Hyun Kim; Sung Kyu Lim; Linda Milor
  • 卷第52卷
  • 文件大小1081.44KB
  • 发表时间2012
  • DOI10.1016/j.microrel.2012.07.002
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