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An Interconnect Reliability-Driven Routing Technique for Electromigration Failure Avoidance

An Interconnect Reliability-Driven Routing Technique for Electromigration Failure Avoidance

Chen, Xiaodao; Liao, Chen; Wei, Tongquan; Hu, Shiyan
  • 作者Chen, Xiaodao; Liao, Chen; Wei, Tongquan; Hu, Shiyan
  • 卷第9卷
  • 期第5期
  • 文件大小519.13KB
  • 发表时间2012
  • DOI10.1109/tdsc.2010.57
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