An Interconnect Reliability-Driven Routing Technique for Electromigration Failure Avoidance
Chen, Xiaodao; Liao, Chen; Wei, Tongquan; Hu, Shiyan
- 作者Chen, Xiaodao; Liao, Chen; Wei, Tongquan; Hu, Shiyan
- 卷第9卷
- 期第5期
- 文件大小519.13KB
- 发表时间2012
- DOI10.1109/tdsc.2010.57