X-Rays and Materials (Goudeau/X-Rays and Materials) || Nanoparticle Characterization Using Central X-Ray Diffraction
Goudeau, Philippe; Guinebretière, René
- 作者Goudeau, Philippe; Guinebretière, René
- 文件大小1145.85KB
- 发表时间2012
- DOI10.1002/9781118562888.ch2
- 页码49-80