SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy - Electrical properties of black silicon
- 作者Cheng, Zhengxi; Chen, Yongping; Ma, Bin; Jiang, Yadong; Yu, Junsheng; Wang, Zhifeng
- 卷第8419卷
- 印刷ISSN0277-786X
- 文件大小323.64KB
- 发表时间2012
- DOI10.1117/12.975674
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