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[IEEE 2012 IEEE/CPMT 28th Semiconductor Thermal Measurement & Management Symposium (SEMI-THERM) - San Jose, CA, USA (2012.03.18-2012.03.22)] 2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - Heat Sink Design Optimization Using the Thermal ShortCut concept

[IEEE 2012 IEEE/CPMT 28th Semiconductor Thermal Measurement & Management Symposium (SEMI-THERM) - San Jose, CA, USA (2012.03.18-2012.03.22)] 2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - Heat Sink Design Optimization Using the Thermal ShortCut concept

Blackmore, Byron; Parry, John; Bornoff, Robin

作者Blackmore, Byron; Parry, John; Bornoff, Robin
文件大小1133.03KB
发表时间2012
DOI10.1109/STHERM.2012.6188849
页码195-204

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