[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - On the electro-mechanical reliability of NEMFET as an analog/digital switch
Jain, Ankit; Islam, A. E.; Alam, M. A.
- 作者Jain, Ankit; Islam, A. E.; Alam, M. A.
- 文件大小521.14KB
- 发表时间2012
- DOI10.1109/irps.2012.6241915