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[IEEE 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Austin, TX, USA (2012.10.3-2012.10.5)] 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Dual-edge-triggered FF with timing error detection capability

[IEEE 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Austin, TX, USA (2012.10.3-2012.10.5)] 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Dual-edge-triggered FF with timing error detection capability

Namba, Kazuteru; Katagiri, Takashi; Ito, Hideo
  • 作者Namba, Kazuteru; Katagiri, Takashi; Ito, Hideo
  • 文件大小133.79KB
  • 发表时间2012
  • DOI10.1109/dft.2012.6378222
  • 页码187-192
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