[IEEE 2012 7th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS) - Kyoto, Japan (2012.03.5-2012.03.8)] 2012 7th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS) - Characterization of strain fields in graphene films
- 作者Dewanto, Raden; Dale, Carl; Hu, Zhongxu; Keegan, Neil; Gallacher, Barry; Hedley, John
- 文件大小824.41KB
- 发表时间2012
- DOI10.1109/nems.2012.6196712
- 页码15-18
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