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[IEEE 2012 IEEE 30th VLSI Test Symposium (VTS) - Maui, HI, USA (2012.04.23-2012.04.25)] 2012 IEEE 30th VLSI Test Symposium (VTS) - Analog/RF test ordering in the early stages of production testing

[IEEE 2012 IEEE 30th VLSI Test Symposium (VTS) - Maui, HI, USA (2012.04.23-2012.04.25)] 2012 IEEE 30th VLSI Test Symposium (VTS) - Analog/RF test ordering in the early stages of production testing

Akkouche, Nourredine; Mir, Salvador; Simeu, Emmanuel; Slamani, Mustapha

作者Akkouche, Nourredine; Mir, Salvador; Simeu, Emmanuel; Slamani, Mustapha
文件大小1853.74KB
发表时间2012
DOI10.1109/vts.2012.6231075
页码25-30

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