[IEEE 2012 IEEE/CPMT 28th Semiconductor Thermal Measurement & Management Symposium (SEMI-THERM) - San Jose, CA, USA (2012.03.18-2012.03.22)] 2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - New simulation approaches supporting temperature-aware design of digital ICs
Nagy, Gergely; Timar, Andras; Szalai, Albin; Rencz, Marta; Poppe, Andras
- 作者Nagy, Gergely; Timar, Andras; Szalai, Albin; Rencz, Marta; Poppe, Andras
- 文件大小865.34KB
- 发表时间2012
- DOI10.1109/stherm.2012.6188866
- 页码313-318