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[IEEE 2012 IEEE 30th VLSI Test Symposium (VTS) - Maui, HI, USA (2012.04.23-2012.04.25)] 2012 IEEE 30th VLSI Test Symposium (VTS) - Detection of gate-oxide defects with timing tests at reduced power supply

[IEEE 2012 IEEE 30th VLSI Test Symposium (VTS) - Maui, HI, USA (2012.04.23-2012.04.25)] 2012 IEEE 30th VLSI Test Symposium (VTS) - Detection of gate-oxide defects with timing tests at reduced power supply

Qian, Xi; Chao Han, ; Singh, Adit D.

作者Qian, Xi; Chao Han, ; Singh, Adit D.
文件大小721.51KB
发表时间2012
DOI10.1109/VTS.2012.6231090
页码120-126

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