[IEEE 2012 13th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) - Cascais, Portugal (2012.04.16-2012.04.18)] 2012 13th International Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems - Thermal and moisture degradation in SSL system
Koh, Sau; Driel, Willem VD; Zhang, G.Q.
- 作者Koh, Sau; Driel, Willem VD; Zhang, G.Q.
- 文件大小1806.37KB
- 发表时间2012
- DOI10.1109/esime.2012.6191806