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[IEEE 2012 13th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2012.03.19-2012.03.21)] Thirteenth International Symposium on Quality Electronic Design (ISQED) - 24% Power reduction by post-fabrication dual supply voltage control of 64 voltage domains in V<inf>DDmin</inf> limited ultra low voltage logic circuits

[IEEE 2012 13th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2012.03.19-2012.03.21)] Thirteenth International Symposium on Quality Electronic Design (ISQED) - 24% Power reduction by post-fabrication dual supply voltage control of 64 voltage domains in VDDmin limited ultra low voltage logic circuits

Yasufuku, Tadashi; Hirairi, Koji; Pu, Yu; Zheng, Yun Fei; Takahashi, Ryo; Sasaki, Masato; Fuketa, Hiroshi; Muramatsu, Atsushi; Nomura, Masahiro; Shinohara, Hirofumi; Takamiya, Makoto; Sakurai, Takayasu

作者Yasufuku, Tadashi; Hirairi, Koji; Pu, Yu; Zheng, Yun Fei; Takahashi, Ryo; Sasaki, Masato; Fuketa, Hiroshi; Muramatsu, Atsushi; Nomura, Masahiro; Shinohara, Hirofumi; Takamiya, Makoto; Sakurai, Takayasu
文件大小2023.14KB
发表时间2012
DOI10.1109/isqed.2012.6187553
页码586-591

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